Inspection Equipment
Imported Wafer Inspection Lamp (Wafer Detection Light)
QG-150/QG-250 inspection light source for surface defect inspection of Si, GaAs, Ge, glass and more - even tiny defects are detectable. For wafer appearance inspection to quickly identify particles, scratches and stains.
01Product Details
01 Product Overview
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QG-150/QG-250
Application: illumination source for surface defect inspection of Si, GaAs, Ge, glass and other materials - tiny defects can be detected. A high-standard inspection tool.
Product Name: Wafer Visual Inspection Lamp
Model: QG-150/QG-250
Application: wafer defect inspection - visual inspection lighting - high brightness - multiple colors optional
Core Features: ultra-high brightness - cold mirror design - multi-color source - adjustable focus
02Technical Specifications
| Input Voltage | AC220V 50Hz |
|---|---|
| Output Voltage | DC 0V - DC 24V |
| Power | 250W |
| Cooling | Forced air cooling |
| Light Source | Halogen lamp |
| Color Temp | White |
| Illuminance | >= 400,000 lux |
| Beam Range | 30-60mm |
| Working Distance | 140-300mm |
| 600000 lux | 4000K 1.5KW 50mm 30-50mm 140-300mm |
| Max Illuminance | Color temp / total power (220V AC) / beam diameter / detection height range |
Need selection guidance or a customized solution? Talk to our engineers.
